Advanced Sorting Technology

Introduction

SP Industrial 採用先進篩選技術（Advanced Sorting Technology，AST）對 NAND Flash 進行測試與分類，專為滿足工業客戶多樣化的溫度需求而設計。該技術精確評估 NAND Flash 記憶體的耐用性與穩定性，並依據嚴格的測試結果準確分類。此嚴謹流程確保分類後的 NAND Flash 完全符合寬溫工業應用的嚴格標準。

AST 測試流程：

SP Industrial 透過 AST 測試，將 NAND Flash 分為三個不同類別。測試涵蓋多種溫度與資料傳輸速率，以確保產品在寬溫範圍內持續穩定運作。此嚴格方法模擬嚴苛環境條件，並驗證每一世代技術能在最高速率下達到最佳運作效果。

1. Electrical Testing: This phase checks current, voltage, and short-circuit issues within the NAND Flash to guarantee normal electrical functionality.
2. Functional Testing: Conducts multiple Read, Write, and Erase operations are performed in both SLC and TLC modes to confirm proper device functionality.
3. Error Bit Testing: Records Error Bits during the process and classifies NAND Flash into wide-temperature and normal-temperature categories based on the results.

Only NAND Flash successfully passing rigorous AST testing is integrated into wide-temperature products, guaranteeing the highest quality and stability. This technology precisely grades NAND Flash for diverse applications while significantly enhancing the overall reliability and durability of SP Industrial's products.