Sorting

To meet the needs of industrial customers operating under various temperature conditions, SP employs Advanced Sorting Technology (AST) for NAND Flash testing and classification. This technology accurately evaluates the durability and stability of NAND Flash and classifies them based on test results to meet the strict requirements of wide-temperature applications.

AST testing is conducted under the following conditions:

• Testing temperature: Maintained throughout the wide-temperature range to simulate usage in harsh environments.  
• Data transfer rate: Tested at the maximum speed for each technological generation.

Testing modes are divided into three categories:

1. Electrical testing: Checks for current, voltage, or short-circuit issues in the NAND Flash to ensure normal electrical functionality.  
2. Functional testing: Conducts multiple Read, Write, and Erase operations in SLC and TLC modes to confirm proper functionality. 
3. Error Bit testing: Records Error Bits during the process and classifies NAND Flash into wide-temperature and normal-temperature categories based on the results.
4. Only NAND Flash that passes the rigorous AST testing is used in wide-temperature products, ensuring they meet the highest standards of quality and stability.

AST technology not only ensures precise grading of NAND Flash for different application environments but also significantly enhances the reliability and durability of SP products.