Advanced Sorting Technology

SP Industrial setzt die fortschrittliche Sortiertechnologie (Advanced Sorting Technology, AST) für die Prüfung und Klassifizierung von NAND-Flash ein, die speziell entwickelt wurde, um die unterschiedlichen Temperaturanforderungen industrieller Kunden zu erfüllen. Diese Technologie bewertet präzise die Haltbarkeit und Stabilität des NAND-Flash-Speichers und klassifiziert ihn anschließend auf Basis strenger Testergebnisse genau. Dieser sorgfältige Prozess stellt sicher, dass der klassifizierte NAND-Flash die strengen Anforderungen von Industrieanwendungen mit weitem Temperaturbereich vollständig erfüllt.

Garbage Collection

Solid-state drives (SSDs) utilize NAND flash memory to store data, employing a process managed by the controller to ensure efficient storage and retrieval. Unlike traditional storage methods, SSDs cannot directly overwrite old data with new data. Instead, the existing data in the relevant block must first be erased before new data can be written. This process is facilitated through a mechanism known as Garbage Collection.

Bad Block Management

Bad Block Management is a mechanism used by the controller in flash memory to detect and handle bad blocks. It identifies and marks unusable blocks to ensure they are excluded from future data storage.

pSLC

SP Industrial bridges the gap between SLC and MLC/3D TLC solutions with pseudo-SLC (pSLC) Flash, a more advanced variant of MLC/3D TLC. pSLC offers faster speeds, higher program/erase cycle endurance, and better reliability than standard MLC/3D TLC, while being more cost-effective than SLC. It operates similarly to SLC but has fewer program/erase cycles, making it an efficient choice for applications demanding high endurance.

Wear Leveling

Wear leveling is a crucial technique for addressing the inherent limitations of NAND flash memory. It manages the wear rate across the entire NAND flash device, ensuring that each memory block is utilized as evenly as possible. Effective wear leveling is essential for maximizing the lifespan and reliability of the flash device.